
The decoder is a greedy single-qubit corrector: it identies the data qubit whose correction
would satisfy the largest number of triggered stabilizers, and ips it. After correction,
every void is checked for a residual weight-3 logical (all three void edges still in error). If
such a logical exists and was not agged, the trial is counted as a logical failure.
7.2 Results
We simulate lattice sizes
L = 4, 6
(corresponding to
n = 192, 648
data qubits and
N
void
=
256, 864
voids) at physical error rates
p ∈ [0.2%, 10%]
, with 5,000 trials per data point.
Note that
L < 4
yields degenerate lattices where the asymptotic formula
n = 3L
3
does
not hold (
L = 2
gives only 6 edges, far fewer than
3 × 8 = 24
), so we restrict to
L ≥ 4
.
Figure 2 shows the results. Without ags (
R = 0
), the logical error rate grows with
both
p
and
L
, as expected: a larger lattice has more voids and therefore more vulnerable
locations. With
R = 1
ag round, the logical error rate is visibly suppressed at all error
rates. At
R = 2
, failures drop below the statistical oor (
< 2 × 10
−4
) for
p < 3%
. At
R = 4
, no logical failures are observed for
L = 4
at any error rate up to 10%, and only
a single failure at
p = 10%
for
L = 6
conrming that four ag rounds push the failure
probability well below
10
−3
across the practical noise range.
These results conrm three properties of the ag mechanism: (i) each ag round adds
genuine error suppression, (ii) the suppression holds under measurement noise and hookup
errors, and (iii) the analytical
d
eff
= 3 + R
scaling is a reliable guide.
7.3 Circuit-level noise
The phenomenological model assumes independent errors. To test the ag mechanism
under realistic conditions, we simulate the full gate-level circuit with depolarizing noise.
Each syndrome extraction round applies 12 CNOT gates per stabilizer (ancilla prepared
in
|0⟩
, data qubits as controls, ancilla measured in
Z
). Each ag round applies 3 CZ
gates per void (ag prepared in
|+⟩
, measured in
X
). Every two-qubit gate location
draws from the full 15-element depolarizing channel at rate
p
(each of the 15 non-identity
two-qubit Pauli operators applied with probability
p/15
). Single-qubit preparation and
measurement each fail with probability
p
. Error propagation through CNOT and CZ
gates is tracked in the Pauli frame:
X
on a CNOT control propagates to the target;
Z
on
a CZ control propagates
Z
to the other qubit.
Figure 3 shows the results. Without ags (
R = 0
), the circuit-level threshold sits near
p
th
≈ 1
1.5%
, comparable to the surface code under similar noise. The
L = 6
failure rate
exceeds
L = 4
above
p ≈ 1.5%
, conrming threshold crossing. With
R = 1
, the failure
rate is suppressed at all error rates. At
R = 2
, only a single failure event is detected
across all data points. At
R = 4
, zero failures are observed at any error rate up to 2% for
either lattice size.
The ag mechanism survives correlated gate noise. The CZ hookup errorswhich can
simultaneously inject a data error and corrupt the ag outcomeare included in the 15-
channel depolarizing model. Despite this, four ag rounds are sucient to push the logical
7